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Evaluation Of Carbon And Sulfur In Cast Iron

The scan was over an location of 600 × 400 nm2 with a step size of ten nm. The lattice parameters and measurement error are converted from diffraction peaks and uncertainty of peak detection, respectively, following our preceding works55,56. STEM images have been acquired using JEOL ARM 200F equipped with a cold field emission source operated at 200 kV. STEM EDS mapping was acquired utilizing an Oxford X-Max 100TLE windowless SDD detector equipped with JEOL ARM 200F. three% HNO3 was utilized as the diluting matrix for all the Li recovery solutions. & Berengue, O. M. Green synthesis and applications of...